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Name: MAC Calibration Standards for SEM TEM BSD BSED STEM Description: MAC manufacture standards for the following micro-analysis systems: AUGER, BSED, EDX, SEM, STEM, TEM, WDX, XRF, and micro-probe. They a Category: Electron Microscopy Url: http://www.kvision.nl/Producten/MAC/MAC.html Date: 02-10-2003 Current Rating: 5.00
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